WHY Kx FOR SEMICONDUCTORS?

Semiconductor manufacturing faces an increasing number of data challenges from managing large volumes of data from multiple sources to generating actions to improve the Fab. Kx technology can handle with ease the demands of fast data in semiconductor manufacturing, specifically the fabrication and wafer test areas.

Our platform is ideally suited for providing solutions for Fabs, Process Tools, and Test Areas with functionality for:

• Ingesting increasing volume and velocity of fab data
• Managing disparate data types and sources
• Creating critical KPI’s from complex and numerous data signals
• Enabling real-time visualizations and analytics for decision making
• Characterization of real-time data signals with respect to historical signatures
• Identifying root causes for poor tool performance, process variation, defects and yield loss; especially spatially and temporally
• Actively minimizing yield loss and improving tool/process health using corrective actions

Kx can manage all your data inputs in one platform and enable a complete solution to the fab. In addition, Kx can integrate with your existing architecture to take advantage of high need and value use cases.


  • FAB BIG DATA
    CHALLENGES

    FAB BIG DATA <br/>CHALLENGES
  • MULTIPLE DATA
    TYPES & INPUTS

    MULTIPLE DATA <br/>TYPES & INPUTS
  • CREATING CRITICAL
    KPI’S

    CREATING CRITICAL <br/>KPI’S
  • DATA VISUALIZATIONS
    & ANALYTICS

    DATA VISUALIZATIONS <br/>& ANALYTICS
  • ROOT CAUSE
    ANALYSIS

    ROOT CAUSE <br/>ANALYSIS

PERFORMANCE

Semiconductor manufacturers are being swamped by the colossal amounts of data they have to process, analyze and store as part of the production process. Even more concerning is that it is becoming increasingly more difficult to unlock the rich value of that data as its volume and velocity increases. Kx, with its superior columnar-structured time-series database kdb+ and q, its integrated query and functional language, enables you to scale anywhere from thousands to hundreds of millions of sensors, at any measurement frequency whilst maintaining extremely high levels of performance.

• Ingest and process 20 million streaming sensor readings per second
• Store daily data volumes exceeding 10TB
• Support analysis of trillions of data points
• Process events in sub-millisecond timeframes

PERFORMANCE

WHERE WE OPERATE AND HOW WE ARE DEPLOYED

Our solutions excel in capturing tool trace data, process parametric data, fab yield and test data to enable real-time process monitoring and analytics that improve fault detection, quality and yield. Our solutions also take advantage of the volume and velocity of real-time and streaming data and integrate and augment your Fabs current control and database systems. Kx technology can operate from the individual tool to complete factory level and offer a range of deployment options including upstream, midstream and downstream models for integrating and co-existing with your existing systems.

Click here to read more about our flexible deployment options

READ MORE

WHERE WE OPERATE AND HOW WE ARE DEPLOYED

EDGE - REAL TIME DECISIONS MADE NEAR THE SOURCE

Because of its small footprint Kx can be used to perform analytics at the point where data is collected by only collecting the data which has been determined to be useful by the tag or sensor.

• Complex Event Processing (CEP) can be performed on the data drawn in from these sensors on the ‘edge’ with sub-millisecond CEP latencies
• Data can be forwarded securely to a centralized location for consolidated analysis and situational awareness
• Due to its light footprint (600kb), Kx can perform CEP and store data locally when installed on smaller appliances and industrial IoT gateways

EDGE - REAL TIME DECISIONS MADE NEAR THE SOURCE

EXTENDABILITY AND INTEROPERABILITY

An Integrated Development Environment (IDE) and Dashboards enables users to customize and extend product capability for your specific use cases in areas like fault detection, process control and yield ramp where access to large amount of data is critical. A connector framework simplifies integration and coexistence with your existing manufacturing systems, including MES, ERP, and SPC. The solution provides APIs for .NET, Excel, Java, C, C#, C++, Java, Kafka, Matlab, ODBC, Perl, Python, R, Webservices, Websockets, and others to enable you to reuse or augment existing functionality.

EXTENDABILITY AND INTEROPERABILITY

ANALYTICS

The Kx platform supports all sensor measurements, tags and attributes to all measurement frequencies at nanosecond precision. A comprehensive library of time-based functions and models support analytics, reports and alerts on streaming and historical data. EmbedPy enables users to use Python and access the latest machine learning models in kdb+. Accompanying HTML Dashboards provide rich visualization and query capabilities on results across multiple devices.

• Capture, analyze and store high frequency time-series data from thousands of sensors to compare with historical data for fault and anomaly detection
• A comprehensive suite of graphical tools with powerful OLAP drill-down capabilities
• Combine historical and real-time data to make decisions from multiple streams

ANALYTICS
Kx Technology

Kx TECHNOLOGY

The basis for Kx Technology is a unique integrated platform which includes a high-performance historical time-series columnar database called kdb+, an in-memory compute engine, and a real-time streaming processor all unified with an expressive query and programming language called q.

Designed from the start for extreme scale, and running on industry standard servers, the kdb+ database has been proven to solve complex problems faster than any of its competitors.

LEARN MORE

Kx's core technology, the kdb+ time-series database, is renowned for its computational speed and performance, as well as the simplicity of its architecture for large-scale data analytics.

Talk to us today
+44 (0) 28 30258826

Get in touch Request a Demo